Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...
Researchers used advanced electron ptychography to visualize atomic-scale defects inside modern transistors. The technique ...
Scientists at the Department of Energy's Lawrence Berkeley National Laboratory (Berkeley Lab) have developed a new way to determine atomic structures from nanocrystals previously considered unusable, ...
A new computational method allows modern atomic models to learn from experimental thermodynamic data, according to a ...
The world of nanoscale analysis has been revolutionized by the advent of electrical Atomic Force Microscopy (AFM) modes. New possibilities for measuring electrical properties with remarkable precision ...
The ‘Tapping Mode SQUID-on-Tip’ (TM-SOT) microscope enables multimodal imaging to be performed extremely close to the sample surface using tapping mode feedback. This allows for stability during ...
(Nanowerk Spotlight) Making electronic devices smaller requires components that work reliably at tiny scales. While engineers have successfully miniaturized many electronic parts, they face a ...
AZoNano speaks to Dr. John Miao about his involvement in the breakthrough research that could rewrite our understanding of how substances are formed at an atomic level. Using an innovative atomic ...
Imagine having a super-powered lens that uncovers hidden secrets of ultra-thin materials used in our gadgets. Research led by University of Florida engineering professor Megan Butala enables a novel ...
Material engineers and scientists have long wanted to understand the atomic structures of amorphous solids such as glass, rubber and plastics more fully. Unlike the structures of crystalline materials ...
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